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Integrated Wafer Inspection

MK Universal has experience in implementing Integrated Wafer Inspection systems (IMM – Integrated Measurement modules.

IMM - A measurement module intended to be integrated into manufacturing equipment, and with the capability of receiving substrates from the equipment, measuring those substrates, and returning the substrates and the measurement results to the equipment and other concerned clients.Some of the services offered in this area are:

Macro Wafer Inspection
Automated Review
KLARF file reading/writing
Recipe Development
Waferless Recipe Creation.
Automated Defect Classification
Edge Inspection
Tool Matchi